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1. Identity statement
Reference TypeJournal Article
Sitemtc-m21c.sid.inpe.br
Holder Codeisadg {BR SPINPE} ibi 8JMKD3MGPCW/3DT298S
Identifier8JMKD3MGP3W34R/449CJGB
Repositorysid.inpe.br/mtc-m21c/2021/03.02.16.36   (restricted access)
Last Update2021:03.02.16.36.38 (UTC) simone
Metadata Repositorysid.inpe.br/mtc-m21c/2021/03.02.16.36.38
Metadata Last Update2022:04.03.23.14.26 (UTC) administrator
DOI10.1016/j.optmat.2020.110795
ISSN0925-3467
Citation KeySilvaBern:2021:MuPoSi
TitleMultilayer porous silicon as visible radiation absorber
Year2021
MonthFeb.
Access Date2024, May 09
Type of Workjournal article
Secondary TypePRE PI
Number of Files1
Size4952 KiB
2. Context
Author1 Silva, Ana Carolina Fernandes da
2 Berni, Luiz Angelo
Resume Identifier1
2 8JMKD3MGP5W/3C9JHMN
Group1
2 COPDT-CGIP-INPE-MCTI-GOV-BR
Affiliation1 Universidade Federal de São Paulo (UNIFESP)
2 Instituto Nacional de Pesquisas Espaciais (INPE)
Author e-Mail Address1 acfsilva@unifesp.br
2 luiz.berni@inpe.br
JournalOptical Materials
Volume112
Pagese110795
Secondary MarkA1_ENGENHARIAS_II A2_MATERIAIS A2_INTERDISCIPLINAR A2_ENGENHARIAS_IV A2_ENGENHARIAS_III A2_BIODIVERSIDADE B1_QUÍMICA B1_ODONTOLOGIA B1_MEDICINA_II B2_BIOTECNOLOGIA B2_ASTRONOMIA_/_FÍSICA
History (UTC)2021-03-02 16:36:38 :: simone -> administrator ::
2021-03-02 16:36:43 :: administrator -> simone :: 2021
2021-03-02 16:37:19 :: simone -> administrator :: 2021
2021-06-22 19:11:14 :: administrator -> simone :: 2021
2021-06-23 13:15:33 :: simone -> administrator :: 2021
2022-04-03 23:14:26 :: administrator -> simone :: 2021
3. Content and structure
Is the master or a copy?is the master
Content Stagecompleted
Transferable1
Content TypeExternal Contribution
Version Typepublisher
Keywordsporous silicon
black silicon
reflectance
electrochemical etching
AbstractSince its accidental discovery in the mid-1950s, porous silicon has attracted great interest due to its wide range of applications. One of them that has been the subject of recent studies is the use of this material as black silicon, in which with the continuous or gradual variation of the refractive index it is possible to significantly reduce the reflectance of silicon surface. In this work, several samples of this material were produced in order to analyze the feasibility of using porous silicon as a radiation absorber in the visible region. The best results obtained were for samples with six layers with refractive index ranging from 1.4 to 2.4, total thickness of 10,800 nm and reflectance of 5%. The influence of porous layer thickness on the reflectance profile was also observed.
AreaFISMAT
Arrangementurlib.net > BDMCI > Fonds > Produção a partir de 2021 > CGIP > Multilayer porous silicon...
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4. Conditions of access and use
Languageen
Target Filesilva_multilayer.pdf
User Groupsimone
Reader Groupadministrator
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Visibilityshown
Archiving Policydenypublisher denyfinaldraft24
Read Permissiondeny from all and allow from 150.163
Update Permissionnot transferred
5. Allied materials
Next Higher Units8JMKD3MGPCW/46KUES5
Citing Item Listsid.inpe.br/bibdigital/2022/04.03.23.11 6
DisseminationWEBSCI; PORTALCAPES; SCOPUS.
Host Collectionurlib.net/www/2017/11.22.19.04
6. Notes
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